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|Title:||Voltammetric study of dental solid amalgams in HCl and their application for detecting Cu(II) ions in solution|
|Author:||Gonzalez-Lopez A, J.L.|
|Abstract:||A voltammetric characterization of a dental amalgam and simple solid metal amalgams and their applications for detecting low concentrations of Cu(II) ions in solution is presented. Dental amalgams display a series of oxidation peaks characteristic of the different metal phases present. A reaction between deposited copper and γ2-Sn7-8Hg phase which transforms into a η′-Cu6Sn5 phase has been proposed to explain the well defined oxidation peaks in the potential range of-0.2 to 0.1 V vs. SCE. Dental amalgams were not found suitable for detecting Cu(II) ions in solution, due to the interference between the γ2-Sn7-8Hg oxidation peak and the copper stripping peak. Instead of a dental amalgam a silver amalgam, i.e, Ag-Hg, is recommended as a better option for detecting Cu(II) ions in solution at low concentrations. It yields a well defined oxidation peaks for copper stripping without having interfering oxidation peaks for the amalgam phase oxidation. ©The Electrochemical Society.|
|Appears in Collections:||Producción científica UdeG (prueba)|
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